Professor - Electrical and Computer Engineering
Educational Background: Schulz earned a BS in electrical engineering from California State University-Long Beach in 1985, an ME in electrical engineering from University of Southern California in 1987, and a PhD in electrical engineering from Washington University, St. Louis in 1990.
Professional Experience: Served as technical consultant to Centice, MZ Associates, General Dynamics, Trex Enterprises, Lockheed Martin, and the Institute for Defense Analysis. He has worked as a research engineer for the Environmental Research Institute of Michigan, and as an engineer for Hughes Aircraft Company.
Professor – Electrical & Computer Engineering (2003-2018).
Professor – College of Engineering (2010-2012).
Associate Professor – Electrical & Computer Engineering (1997-1999, 2000-2003).
Assistant Professor – Electrical & Computer Engineering (1992-1997).
Dean. (July 1, 2011 - June 30, 2012).
Dean, College of Engineering. (July 1, 2007 - June 30, 2011).
Chair, Electrical and Computer Engineering. (August 1, 2005 - June 30, 2007).
Endowed Chair. (August 1, 2005 - June 30, 2007).
Endowed Chair. (August 18, 2003 - May 6, 2005).
Areas of Expertise:
Statistical signal processing
Courses Taught at Michigan Tech:
EE 2111, Electric Circuits I, 4 courses.
EE 2150, Intro to Signal Processing, 3 courses.
EE 3180, Probability - Signal Analysis, 7 courses.
EE 3190, Optical Sensing and Imaging, 3 courses.
EE 321, Signal and System Analysis 1, 3 courses.
EE 322, Signal and System Analysis 2, 2 courses.
EE 331, Network Analysis 4, 2 courses.
EE 407, Prin Communication Systems 1, 2 courses.
EE 418, Communication Systems 2, 1 course.
EE 421, Digital Signal Processing, 1 course.
EE 422, Appl Digital Signal Processing, 3 courses.
EE 4257, Digital Image Processing, 1 course.
EE 435, Digital Signal Processing, 1 course.
EE 490, Spec Topics Electrical Engr, 1 course.
EE 4901, EE Design Project 1, 2 courses.
EE 4910, EE Design Project 2, 2 courses.
EE 500, Graduate Research Elect Engr, 23 courses.
EE 501, Statistical Signal Process 1, 2 courses.
EE 502, Statistical Signal Process 2, 6 courses.
EE 5500, Prob & Stoch Processes, 2 courses.
EE 5510, Information Theory & Coding, 2 courses.
EE 5511, Information Theory, 2 courses.
EE 5521, Detection & Estimation Theory, 2 courses.
EE 5522, Digital Image Processing, 2 courses.
EE 5540, Statistical Optics, 2 courses.
EE 5805, Directed Study in Elec & Comp, 2 courses.
EE 5900, Imaging & Spectroscopy, 2 courses.
EE 5950, Signals and Systems Seminar, 1 course.
EE 5990, Thesis Research in EE, 3 courses.
EE 5991, Project Research in EE, 2 courses.
EE 5992, Practical Experience in EE, 1 course.
EE 600, Doctoral Research, 13 courses.
EE 604, Adv Topics in Signal Processing, 1 course.
EE 6990, Doctoral Research, 29 courses.
Fellow of the International Society for Optical Engineering, SPIE.
Fellow of the Optical Society of America.
Member, Tau Beta Pi.
Teaching Excellence Award Finalist, Michigan Tech. (1996).
Faculty Early Career Development Award, NSF. (1995).
Best Paper Award - Infrared Information Symposium, IRIS. (1990).
Published Works (Selected):
2017. Schulz, T. J. Published Piston alignment for a segmented-aperture imaging system by using piston-sweep phasing. Optics Letters. Optical Society of America.
2009. Fugal, J. P., Schulz, T. J., Shaw, R. A. Published Practical methods for automated reconstruction and characterization of particles in digital in-line holograms. Measurement Science and Technology 20(7). Measurement Science and Technology.
2007. Hart, N., Roggemann, M. C., Sergeyev, A. V., Schulz, T. J. Published Characterizing static aberrations in liquid crystal spatial light modulators using phase retrieval. 46. Optical Engineering.
2006. Cauquy, M.-A., Roggemann, M. C., Schulz, T. J. Published Distance-based and neural-net-based approaches for classifying satellites using spectral measurements. 45, 036201. Opt. Eng.
2003. Beyer, J. T., Roggemann, M. C., Otten, L. J., Schulz, T. J., Havens, T. C., Brown, W. W. Published Experimental estimation of the spatial statistics of turbulence-induced index of refraction fluctuations in the upper atmosphere. Applied Optics(42), 908-921.